Measurement Capability
Parameter / Test | Range / Accuracy / Specifications |
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Discrete Semiconductors | MIL, JSS, IEC,IS, Customer Specifications |
List of Major Facility
Facility / Equipment / Tools | Make and Model |
---|---|
Discrete Semiconductor Test System | Tesec, 8101-TT/A |
Oscilloscope | Tektronix, 7854 |
fT Measuring Set | KOKUYA, 2010C |
True RMS Digital Multimeter | Fluke, 289 |
Pulse Geneerator | System Doner, 110D |
DC Current Source | HP 6177C |
Programmable DC power supply | Amtek XG 100-17 |
Multi frequency LCR Meter | Hp/4274A |
Multi frequency LCR Meter | Hp/4275A |
RCL Meter | Fluke/PM6306 |
Major Products Tested / Project Done
Major Products Tested / Projects Done |
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Resistors, Capacitors, Inductors, Transformers, Diodes, Transistors, Battery, Opto-couplers, SCR etc. |