For reliable product development product evaluation under simulated conditions of user environment is must. Environmental testing has therefore become a part and parcel of each stage in the product development cycle starting from Design through Prototype / Engineering model fabrication and final production offs: Environmental testing tools (both climatic and mechanical durability and electrical endurance) are used not only to evaluate the final product performance but also to built quality into the product through stress screening of PCB’s, Sub Modules & Modules as well. All these are necessary to avoid unwanted and costly field failures.
Establishing and maintaining environmental test facilities being quite expensive. Government of India at its own cost has set-up this Test Centre, ETDC-Bangalore, to render services and help industries in their product development.
| Test Parameter | Test Method / Standard |
|---|---|
|
Cold Test |
IS 9000 (Part II/Sec 1 to 4) 2013 , IEC 68-2-1:2007 JSS 50101:1996 & JSS 55555:2012 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 |
|
Dry Heat Test |
IS 9000:(Part III/Sec 1 to 5) 2010, IEC-68-2-2:2007 QM 333/Issue-2010 |
|
Temperature cyclic test |
IS 9000 (Part 14):2015 IEC 68-2-14: NB:2009 JSS 50101:1996 JSS 55555:2012 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 QM301:2002 |
|
Temperature shock |
IS 9000 (Pt 14):2015 IEC 68-2-14-NC:2009 JSS 50101:1996 JSS 55555:2012 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 |
|
Damp heat steady state |
IS 9000 (Pt IV):2015 IEC 68-2-78:2012 JSS 50101:1996 JSS 55555:2012 |
|
Damp heat cyclic test |
IS 9000 (Pt V):2010 IEC 68-2-30:2005 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 |
|
Salt spray test |
IS 9000 (Pt XI):2010 JSS 50101:1996 JSS 55555:2012 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 ASTM B117 |
|
Dust test |
IS 9000 (Pt XII):2010 JSS 50101:1996 JSS 55555:2012 QM 333/Issue-2010 |
|
Composite Temperature Humidity test |
IS 900 (Pt VI):2010 JSS 50101:1996 JSS 55555:2012 |
|
Vibration |
IS 9000(Pt VIII):2015 IEC 68-2-6:2007 JSS 50101:1996 JSS 55555:2012 MIL-STD 202G:2002 MIL 810G:2014 QM 333/Issue-2010 |
|
Bump Test |
IS 9000 (Pt VII/sec 2):2013 IEC 68-2-29: JSS 50101:1996 JSS 55555:2012 QM 333/Issue-2010 |
|
Drop , Free fall & Topple tests |
IS 9000 (Pt VII/Sec 3 & 4:2013) QM 333/Issue-2010 |
Major Products Tested
- Electrical / Electronic products
- Telecom products
- Power products such as UPS, SMPS and Power Supplies etc.,
- IT products such as 2D Barcode Scanner, Multifunction Printers ,Synchronous Multiplexer , Laptops, and portable tablet computers etc.,
- Defence / Air force / Navy products
- Prototype products
- Chemical / Mechanical Products
