ERTL (South) undertakes testing of components like Integrated Circuits, Discrete Devices, Resistors, Capacitors, Inductors, Crystal Oscillators, Pulse Transformers etc. as per MIL/ JSS/ IEC/IS/ Customer Specifications.
ERTL (South) is the leading laboratory in the country for the Screening of Electronic devices like LCR devices, Discrete devices, Digital and linear ICs of different sizes and different packages.
Measurement Capability
| Parameter / Test | Range / Accuracy / Specifications |
|---|---|
|
Digital Integrated Circuits (SSI/MSI/LSI) |
Functional & Parametric Measurements |
|
Clamp Voltage |
0 to -10 V |
|
Output Voltage |
0 to 20 V |
|
Input Current/ Off state current/ Output Current |
0 to 10 mA |
|
Short Circuit Current/ Supply Current |
0 to 200 mA |
|
Threshold Voltage |
-10 V to +10 V |
|
Delay Time |
0-900 ns |
| Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) | Functional & Parametric Measurements |
|
Offset Voltage |
0-200 mV |
|
Offset/Bias Current |
0-20 µA |
|
CMRR/ PSRR |
130 dB |
|
Slew rate |
0-100 V/µs |
|
Open Loop Gain |
130 dB |
|
GBP |
200 MHz |
|
Output Voltage |
±16 V & 0-51 V |
|
Supply Current |
0 to 200 mA |
|
Line/ Load Regulation |
0-1500 mV |
|
Ripple Rejection |
100 dB |
|
Quiescent Current |
0-250 mA |
|
Short Circuit Current |
0-3.2 A |
|
|
|
| Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) | Functional & Parametric Measurements |
|
Discrete Devices
|
3000 V/ 400 A |
|
Resistors
|
1 Ω to 1 MΩ (NABL accredited) |
|
Capacitors
|
10 pF to 1 F |
|
Inductors |
1nH to 10 H (Test frequency up to 30 MHz) |
|
Crystal Oscillators |
Square wave up to 80 MHz
|
|
Pulse Transformers |
180 mA/ 60 V (Max) ,Single & dual type |
List of Major Facilities
| Facility / Equipment / Tools | Make and Model |
|---|---|
|
Universal Test System |
SZ M3000 |
|
Intelligent Universal Programmer |
ESA IUP- XP |
|
Programmable DC Source |
Yokogawa- 7651 |
|
Digital Storage Oscilloscope |
TDS-2014 |
|
Curve Tracer |
Tektronix 370A, Tektronix 371A |
|
8½ digit Digital Multimeter |
Fluke 8508A |
|
7½ digit Digital Multimeter |
Wavetek 1271 |
|
Digital Storage Oscilloscope |
Tektronix 3054C, Owon SDS 8202 |
|
LCR Meter |
Agilent E4980A, HP 4284A, HP 4285A |
|
Function Generator |
Tektronix AFG3051C |
Major Devices Tested (Leaded / SMD)
- Digital Integrated Circuits (SSI/MSI/LSI)
- Linear Integrated Circuits (Op-amp/ Regulator/ PWM)
- Discrete Devices (Diodes, Transistors, MOSFETs, SCRs ….)
- Passive Devices (Resistors, Capacitors, Inductors)
- Crystal Oscillators
- Pulse Transformers
